electron emission microscopy

常见例句

In this paper principle and application of Ballistic Electron Emission Microscopy (BEEM) is described. Some results obtained with home made setup of BEEM are shown.
本文简单介绍了弹道电子发射显微镜（BEEM）的原理和应用，并给出了用自行研制的BEEM设备得到的一些实验结果。
Two methods used in the microanalysis of semiconductor interfaces, Ballistic Electron Emission Microscopy (BEEM)and Scanning Internal Photoemission Microscopy (SIPM), are described.
介绍了可以在微观级对半导体界面的电学性质进行评价的两种新技术及其应用。
The structures of the composite films were characterized by field emission scanning electron microscopy (FESEM), Fourier transform infrared spectroscopy (FTIR) and thermo gravimetric analysis (TGA).
采用场发射扫描电镜（FESEM）、红外光谱（FTIR）、热重分析（TGA）等方法对复合膜结构进行表征。
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