bulk resistivity

基本解释

The Pro4 provides simple answers to sheet and bulk resistivity measurements of wafers and thin films.
用于半导体晶片或薄膜的电阻率和表面电阻的测试。
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The effects of silver particles morphologies and size on the electrical bulk resistivity of conductive adhesive were described.
从导电性角度考查银粉颗粒形貌和粒径大小对导电胶电阻率的影响。
Numerical results indicate how the various parameters such as bulk resistivity and carrier diffusion length in the active region affect the profiles.
以数值结果揭示外延层的体电阻率及厚度、活性区载流子的扩散长度、模增益和丝区宽度等参量对上述各种分布的影响。