laser plane interferometer

基本解释

The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
To enable dimensional calibrations in the same set-up as for form measurements, a plane-mirror laser interferometer has been added.
使空间的口径测定能够在那相同的组合- 向上的当做为形式测量，一个飞机- 镜子激光干涉计有被增加。
Digital laser plane interferometer is used to measure the surface of optical components and the wavefront aberration of non-confocal optical system.
数字式激光平面干涉仪是用于测量光学元件面形和无焦光学系统波像差的光学仪器。